Title :
Alpha Particle Induced Single Event Upsets in Bipolar Static ECL Cells
Author :
Voldman, S. ; Patrick, L.
Author_Institution :
IBM General Technology Division Essex Junction, Vermont 05452
Abstract :
A complete study of a bipolar static cell was done to determine alpha particle soft error sensitivities using alpha particle and circuit simulations. The results are supported by experimental data.
Keywords :
Alpha particles; Circuit simulation; Doping; Error analysis; Integrated circuit technology; Logic devices; Monte Carlo methods; Semiconductor process modeling; Single event upset; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333482
