• DocumentCode
    875186
  • Title

    Investigation of Heavy Particle Induced Latch-Up, Using a Californium-252 Source, in CMOS SRAMs and PROMs

  • Author

    Stephen, J.H. ; Sanderson, T.K. ; Mapper, D ; Hardman, M ; Farren, J ; Adams, L ; Harboe-Sorensen, R

  • Author_Institution
    UKAEA, I&AP Division, AERE, Harwell, UK
  • Volume
    31
  • Issue
    6
  • fYear
    1984
  • Firstpage
    1207
  • Lastpage
    1211
  • Abstract
    Heavy ion-induced latch-up, in commercial CMOS SRAMs and PROMs, was examined using a laboratory Californium-252 source, in order to simulate the cosmic environment. The ability to use the CASE system (Californium-252 Assessment of Single-event Effects) enabled detailed electrical measurements to be made of the devices in the latched condition.
  • Keywords
    Circuit simulation; Circuit testing; Computer aided software engineering; Cyclotrons; Electric variables measurement; Ionization; PROM; Single event upset; Thyristors; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333484
  • Filename
    4333484
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=875186