Title :
Investigation of Heavy Particle Induced Latch-Up, Using a Californium-252 Source, in CMOS SRAMs and PROMs
Author :
Stephen, J.H. ; Sanderson, T.K. ; Mapper, D ; Hardman, M ; Farren, J ; Adams, L ; Harboe-Sorensen, R
Author_Institution :
UKAEA, I&AP Division, AERE, Harwell, UK
Abstract :
Heavy ion-induced latch-up, in commercial CMOS SRAMs and PROMs, was examined using a laboratory Californium-252 source, in order to simulate the cosmic environment. The ability to use the CASE system (Californium-252 Assessment of Single-event Effects) enabled detailed electrical measurements to be made of the devices in the latched condition.
Keywords :
Circuit simulation; Circuit testing; Computer aided software engineering; Cyclotrons; Electric variables measurement; Ionization; PROM; Single event upset; Thyristors; Very large scale integration;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333484
