• DocumentCode
    87535
  • Title

    Study on Packaging Method Using Silicon Substrate With Cavity and TSV for Light Emitting Diodes

  • Author

    Zhicheng Lv ; Xuefang Wang ; Liang Yang ; Jiaojiao Yuan ; Jing Fang ; Bin Cao ; Sheng Liu

  • Author_Institution
    Sch. of Optoelectron. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    3
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    1123
  • Lastpage
    1129
  • Abstract
    In this paper, a wafer-level packaging method for white light emitting diodes (LEDs) - which uses a silicon substrate with cavities and through silicon vias (TSVs) - is presented. Common semiconductor manufacture processes are used to fabricate the substrate. Some key processes, such as wet etching, electroplating, and wire bonding are studied and optimized. This method offers a compact and low profile structure for LED packaging. The experimental results verify the feasibility of the proposed method. TSVs offer an electrical and thermal conductivity path for electrical interconnection and heat dissipation. Cavity can increase the light extraction efficiency and uniformity of the phosphor printing. And the thickness of the substrate where an LED chip is mounted is less than 200 um because of the cavity. The luminous power of one package unit is about 90 lm with 1W LED chip when color temperature is 4200 K. The thermal resistance of the substrate only is about 1.3 K/W.
  • Keywords
    LED displays; LED lamps; cooling; electrical conductivity; elemental semiconductors; silicon; thermal conductivity; thermal management (packaging); thermal resistance; three-dimensional integrated circuits; wafer level packaging; LED chip; Si; TSV; cavities; color temperature; common semiconductor manufacture processes; electrical conductivity path; electrical interconnection; electroplating; heat dissipation; light extraction efficiency; low profile structure; phosphor printing; power 1 W; silicon substrate; temperature 4200 K; thermal conductivity path; thermal resistance; through silicon vias; wafer-level packaging method; wet etching; white light emitting diodes; wire bonding; Light-emitting diode (LED); packaging; silicon;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2260824
  • Filename
    6523109