DocumentCode :
875419
Title :
Moisture sensing in transformer oil using thin-film microdielectrometry
Author :
Zaretsky, Mark C. ; Melcher, James R. ; Cooke, Chathan M.
Author_Institution :
Lab. for Electromagn. & Electron. Syst., MIT, Cambridge, MA, USA
Volume :
24
Issue :
6
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
1167
Lastpage :
1176
Abstract :
In-situ moisture sensing in transformer oil by measuring the change in dielectric properties of 1- to 7-μm-thick layers of plasma-deposited bromobenzene coated on interdigitated 50-μm-wavelength electrodes of a microdielectrometer chip is demonstrated. Gain-phase measurements in the frequency range of 0.0005 to 10000 Hz, normalized to the frequency of peak phase shift, are found to be universal. Evidence is presented that the coatings act as semipermeable membranes serving as barriers to the transformer oil, but absorbing moisture in proportion to its absolute content in the oil. Sensitivity to moisture from less than 5 to about 50 p.p.m. is found with a transient response of less than a few minutes. Although the method is well suited to following the dynamics of water in paper-oil systems over periods of days or perhaps weeks, a long-term loss of sensitivity must be overcome if the sensor is to be used without recalibration for extended periods of time. Its use for discerning abnormal behavior in a pilot transformer monitoring system is described
Keywords :
electrometers; insulating oils; insulation testing; moisture measurement; organic insulating materials; transformer insulation; 0.0005 to 10000 Hz; 1 to 7 micron; 50 micron; dielectric properties; long-term loss; microdielectrometer chip; moisture sensing; paper-oil systems; peak phase shift; plasma-deposited bromobenzene; recalibration; semipermeable membranes; thin-film microdielectrometry; transformer monitoring system; transformer oil; transient response; Dielectric measurements; Dielectric thin films; Electrodes; Frequency; Moisture measurement; Oil insulation; Plasma measurements; Plasma properties; Semiconductor device measurement; Transistors;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/14.46351
Filename :
46351
Link To Document :
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