Title :
Statistical Procedures for Determining Electronic Part Design Margin Breakpoints
Author :
Clement, David M.
Author_Institution :
TRW Defense Systems Group Redondo Beach, CA 90278
Abstract :
This note presents a set of statistical procedures for accepting or rejecting part types on the basis of lot sample tests-to failure or parameter degradation tests of parts subject to weapon-induced environments.
Keywords :
Degradation; Delta modulation; Equations; Inverse problems; Log-normal distribution; Performance evaluation; Probability; Random variables; System testing; Weapons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333523
