DocumentCode
87569
Title
Analysis of Conduction Characteristics of Field-Breakdown Triggered Vacuum Switches
Author
Gai, Fei ; Chen, S. ; Jiang, Hongbo ; Tian, Wei ; Chen, Jiann-Jong ; Li, Xin
Author_Institution
School of Electrical Engineer, Wuhan University, Wuhan, China
Volume
41
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
2160
Lastpage
2165
Abstract
This paper is concerned with the conduction process of field-breakdown triggered vacuum switches (TVS). The TVS with long gap spacing is fabricated to enlarge the time scale for the investigation of the physical phenomena. According to the image analysis of the conduction process, an approach based on introducing a concept of triggering charge quantity is put forward, which can be used to describe the conduction condition of TVS. Finally, the forming reason of the time delay and the jitter and the influence of the current growth rate and the peak value of trigger current on them are discussed on the basis of test results and come to the conclusion that the injection form of energy plays a prominent part in the conduction process.
Keywords
Delay effects; Jitter; Switches; Vacuum technology; Current growth rate; TVS; jitter; time delay; triggering charge quantity;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2013.2260833
Filename
6523112
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