Title :
Thermal feedback in silicon j.f.e.t.s operating at low temperatures
Author :
Churchill, M.J. ; Lauritzen, P.A.
fDate :
8/1/1971 12:00:00 AM
Abstract :
Thermal feedback modifies the d.c. and a.c. characteristics at temperatures where carrier freeze-out occurs. Data for common source operation are analyzed using the thermal feedback theory of Mueller (abstr. B15319 of 1964).
Keywords :
Carrier density; Field effect transistors; Thermal effects; carrier density; field effect transistors; thermal effects; Charge carrier density; Feedback; Frequency; Impedance; JFETs; Power dissipation; Silicon; Temperature dependence; Thermal resistance; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1971.1050178
