Title :
Small-size low-power bipolar memory cell
Author :
Wiedmann, Siegfried K. ; Berger, Horst H.
Abstract :
A d.c.-stable random-access memory (RAM) cell employing n-p-n and p-n-p transistors has been designed in a concurrent circuit-layout approach. Test chips with 2×3 arrays have been processed in a standard bipolar technology. Due to the merging of devices, the area required for a cell is only 14 mil2. The cells have been operated at an extremely low d.c. standby power of less than 0.1 μW/cell. In spite of this low standby power, an array access time of 10 ns has been measured on a simulated 512-bit array in a pulsed power mode.
Keywords :
Bipolar transistors; Random-access storage; Semiconductor storage devices; bipolar transistors; random-access storage; semiconductor storage devices; Circuits; Electric breakdown; Electron devices; Fabrication; Power dissipation; Pulse measurements; Silicon; Stress; Thermal degradation;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1971.1050188