• DocumentCode
    875902
  • Title

    Bipolar dynamic memory cell

  • Author

    Henn, Horst H.

  • Volume
    6
  • Issue
    5
  • fYear
    1971
  • fDate
    10/1/1971 12:00:00 AM
  • Firstpage
    297
  • Lastpage
    300
  • Abstract
    A bipolar dynamic memory cell for use in a high-speed random- access memory consists of a cross-coupled pair of transistors and two diodes. Information is dynamically stored using a bistable charge distribution and must be refreshed at a frequency of 1 kHz by a SELECT operation. Standby power per memory cell is in the nanowatt range. The cell requires only 3 interconnect lines and can be fabricated with standard bipolar technology on 12-mil/SUP 2/ silicon area. Cycle time is limited by the speed of decoding, driving, and sensing circuits and is estimated to be 50 ns for a 512-bit RAM chip with complete on-chip decoding.
  • Keywords
    Bipolar transistors; Random-access storage; Semiconductor storage devices; bipolar transistors; random-access storage; semiconductor storage devices; Capacitance; Costs; Decoding; Diodes; Fabrication; Frequency; Integrated circuit interconnections; Random access memory; Resistors; Silicon;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1971.1050190
  • Filename
    1050190