Title :
Algorithm for Determining Worst Case Transistor Parameters
Author :
Long, David M. ; Jaffe, Richard C. ; Casey, Richard H.
Author_Institution :
Science Applications Inc. 1200 Prospect St., La Jolla, CA 92038
Abstract :
A technique for the determination of a set of Gummel - Poon tranisistor parameters is presented. Procedures for setting up the required data and the derivation of the relationships needed for the parameter extraction are given. An example that shows this procedure is given.
Keywords :
Circuit analysis; Dielectric substrates; Geophysics; Laboratories; Optical wavelength conversion; Space technology; Space vehicles; Surface charging; Surface discharges; Thermal force;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333560
