DocumentCode
876070
Title
Semiconductor Drift Chambers
Author
Gatti, E. ; Rehak, P. ; Longoni, A. ; Kemmer, J. ; Holl, P. ; Klanner, R. ; Lutz, G. ; Wylie, A. ; Goulding, F. ; Luke, P.N. ; Madden, N.W. ; Walton, J.
Author_Institution
Brookhaven National Laboratory, Upton, N.Y., USA and Politecnico di Milano, Milano, Italy
Volume
32
Issue
2
fYear
1985
fDate
4/1/1985 12:00:00 AM
Firstpage
1204
Lastpage
1208
Keywords
Anodes; Charge measurement; Clouds; Coordinate measuring machines; Current measurement; Electrodes; Electrons; Energy measurement; Laboratories; Pulse amplifiers;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1985.4333575
Filename
4333575
Link To Document