DocumentCode :
876070
Title :
Semiconductor Drift Chambers
Author :
Gatti, E. ; Rehak, P. ; Longoni, A. ; Kemmer, J. ; Holl, P. ; Klanner, R. ; Lutz, G. ; Wylie, A. ; Goulding, F. ; Luke, P.N. ; Madden, N.W. ; Walton, J.
Author_Institution :
Brookhaven National Laboratory, Upton, N.Y., USA and Politecnico di Milano, Milano, Italy
Volume :
32
Issue :
2
fYear :
1985
fDate :
4/1/1985 12:00:00 AM
Firstpage :
1204
Lastpage :
1208
Keywords :
Anodes; Charge measurement; Clouds; Coordinate measuring machines; Current measurement; Electrodes; Electrons; Energy measurement; Laboratories; Pulse amplifiers;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1985.4333575
Filename :
4333575
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=876070
بازگشت