Title :
Reversible-logic design with online testability
Author :
Vasudevan, Dilip P. ; Lala, Parag K. ; Di, Jia ; Parkerson, J. Patrick
Author_Institution :
Dept. of Comput. Sci. & Comput. Engineeering, Univ. of Arkansas, Fayetteville, AK, USA
fDate :
4/1/2006 12:00:00 AM
Abstract :
Conventional digital circuits dissipate a significant amount of energy because bits of information are erased during the logic operations. Thus, if logic gates are designed such that the information bits are not destroyed, the power consumption can be reduced dramatically. The information bits are not lost in case of a reversible computation. This has led to the development of reversible gates. This paper proposes three new reversible logic gates; two of the proposed gates can be employed to design online testable reversible logic circuits. Furthermore, they can be used to implement any Boolean logic function. The application of the reversible gates in implementing several benchmark functions has been presented.
Keywords :
Boolean functions; design for testability; logic design; logic gates; Boolean logic function; Fredkin gate; Toffoli gate; digital circuits; garbage outputs; information bits; logic circuits design; online testability; power consumption; reversible logic design; reversible logic gates; two-pair two-rail checker; Circuit synthesis; Circuit testing; Clocks; Digital circuits; Energy consumption; Logic circuits; Logic design; Logic gates; Logic testing; System testing; Fredkin gate; Toffoli gate; garbage outputs; online testing; reversible logic; two-pair two-rail checker;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2006.870319