DocumentCode :
876587
Title :
Physical origin of the negative output resistance of heterojunction bipolar transistors
Author :
Dagli, Nadir
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
9
Issue :
3
fYear :
1988
fDate :
3/1/1988 12:00:00 AM
Firstpage :
113
Lastpage :
115
Abstract :
An analytical expression for the small-signal output impedance of a heterojunction bipolar transistor (HBT) is obtained based on device physics. It is shown that, when external parasitics are sufficiently reduced so that intrinsic time delays become the dominant limitations to high-frequency performance, the output resistance can be negative over certain bands of frequencies due to transit time delays. Under such conditions amplifiers with high gains can be designed at frequencies where the power gain of the device due to conventional transistor action is very low, and power gain vs. frequency characteristics of the device can be drastically different from the traditional 6-dB/octave rolloff. Analytical expressions that can be used in the design of these devices are derived to obtain the full benefit of negative output resistance.
Keywords :
bipolar transistors; negative resistance; power transistors; device physics; external parasitics; frequency characteristics; heterojunction bipolar transistors; intrinsic time delays; negative output resistance; output resistance; power gain; small-signal output impedance; transistor action; transit time delays; Bipolar transistors; Circuit simulation; Delay effects; Electron emission; Equivalent circuits; Frequency; Heterojunction bipolar transistors; High power amplifiers; Impedance; Physics;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.2059
Filename :
2059
Link To Document :
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