Title :
FASTBUS Diagnostic and Test Modules at Fermilab
Author :
Urish, J. ; Barsotti, E. ; Bowden, M. ; Geibel, L. ; Graves, W. ; Rotolo, C. ; Treptow, K.
Author_Institution :
Fermi National Accelerator Laboratory, Batavia, IL
Keywords :
Backplanes; Displays; Fastbus; Kinetic theory; Logic circuits; Power supplies; Protocols; Switches; System testing; Timing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4333632
