Title :
Optimum source admittance for minimum noise figure of microwave transistors
Author :
B¿¿chtold, W. ; Strutt, M.J.O.
Author_Institution :
Swiss Federal Institute of Technology, Department of Advanced Electrical Engineering, Zÿrich, Switzerland
Abstract :
Noise measurements of microwave transistors have shown that the optimum source admittance with respect to the minimum noise figure approaches the conjugate complex value of the transistor input admittance with increasing frequency. This fact is explained using the noise equivalent circuit of a microwave transistor.
Keywords :
admittance; microwave devices; noise; transistors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19680272