• DocumentCode
    877003
  • Title

    Competitive measures

  • Author

    White, Robert M.

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    30
  • Issue
    4
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    29
  • Lastpage
    33
  • Abstract
    It is argued that technology will not advance as freely as before unless more attention is paid to metrology. The importance of measurement standards and the precarious state of research are examined. The desire of companies to realize standards in their own laboratories with accuracies approaching those of the fundamental standards is discussed. Electrical, dimensional, and time metrology are considered.<>
  • Keywords
    electric variables measurement; measurement standards; spatial variables measurement; time measurement; dimensional metrology; electrical metrology; measurement standards; time metrology; Assembly; Books; Failure analysis; Laser tuning; Manufacturing automation; Metrology; NIST; Remuneration; Technology management; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/6.206619
  • Filename
    206619
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=877003