Title :
Test of the thermal-noise hypothesis in m.o.s.f.e.t.s
Author :
Halladay, H.E. ; van der Ziel, A.
Author_Institution :
University of Minnesota, Department of Electrical Engineering, Minneapolis, USA
Abstract :
Evidence is given that, for m.o.s.f.e.t.s, another source o noise besides thermal noise must be operating in the conducting channel.
Keywords :
noise; transistors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19680287
