• DocumentCode
    877171
  • Title

    Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slabs backed by a conducting plate

  • Author

    Bakhtiari, Sasan ; Ganchev, Stoyan I. ; Zoughi, Reza

  • Author_Institution
    Dept. of Electr. Eng., Colorado State Univ., Ft. Collins, CO, USA
  • Volume
    42
  • Issue
    1
  • fYear
    1993
  • fDate
    2/1/1993 12:00:00 AM
  • Firstpage
    19
  • Lastpage
    24
  • Abstract
    Solutions for fields inside a slab of a generally lossy dielectric medium backed by a conducting plate, placed outside a waveguide-fed rectangular aperture, are used for the microwave nondestructive thickness measurement of such dielectric slabs. Upon construction of the waveguide terminating admittance expression from its variational form, an inverse problem is solved to extract the slab thickness form the conductance and susceptance in a recursive manner. A comparison between the experimental and theoretical results showed that the significance of higher order modes is minimal; hence, the dominant mode assumption is, in general, valid for describing the aperture field distribution. The validity of this assumption has led to the construction of a simple integral solution which is fast converging for generally lossy dielectric slabs, and may easily be implemented for real-time applications. Good agreement was obtained between the theoretical and experimental results. Multiple thicknesses of two different dielectric samples were estimated in this way
  • Keywords
    inverse problems; microwave measurement; rectangular waveguides; thickness measurement; aperture field distribution; conducting plate; dielectric slabs; inverse problem; lossy dielectric medium; lossy dielectric slabs; microwave nondestructive thickness measurement; nondestructive thickness measurement; real-time applications; recursive manner; variation detection; waveguide-fed rectangular aperture; Admittance; Aerospace materials; Apertures; Conducting materials; Dielectric loss measurement; Dielectric losses; Monitoring; Rectangular waveguides; Slabs; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.206673
  • Filename
    206673