DocumentCode
877171
Title
Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slabs backed by a conducting plate
Author
Bakhtiari, Sasan ; Ganchev, Stoyan I. ; Zoughi, Reza
Author_Institution
Dept. of Electr. Eng., Colorado State Univ., Ft. Collins, CO, USA
Volume
42
Issue
1
fYear
1993
fDate
2/1/1993 12:00:00 AM
Firstpage
19
Lastpage
24
Abstract
Solutions for fields inside a slab of a generally lossy dielectric medium backed by a conducting plate, placed outside a waveguide-fed rectangular aperture, are used for the microwave nondestructive thickness measurement of such dielectric slabs. Upon construction of the waveguide terminating admittance expression from its variational form, an inverse problem is solved to extract the slab thickness form the conductance and susceptance in a recursive manner. A comparison between the experimental and theoretical results showed that the significance of higher order modes is minimal; hence, the dominant mode assumption is, in general, valid for describing the aperture field distribution. The validity of this assumption has led to the construction of a simple integral solution which is fast converging for generally lossy dielectric slabs, and may easily be implemented for real-time applications. Good agreement was obtained between the theoretical and experimental results. Multiple thicknesses of two different dielectric samples were estimated in this way
Keywords
inverse problems; microwave measurement; rectangular waveguides; thickness measurement; aperture field distribution; conducting plate; dielectric slabs; inverse problem; lossy dielectric medium; lossy dielectric slabs; microwave nondestructive thickness measurement; nondestructive thickness measurement; real-time applications; recursive manner; variation detection; waveguide-fed rectangular aperture; Admittance; Aerospace materials; Apertures; Conducting materials; Dielectric loss measurement; Dielectric losses; Monitoring; Rectangular waveguides; Slabs; Thickness measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.206673
Filename
206673
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