Title :
Built-in self-test structure for mixed-mode circuits
Author_Institution :
Dept. of Electr. Eng., Alabama Univ., Tuscaloosa, AL, USA
fDate :
2/1/1993 12:00:00 AM
Abstract :
A built-in self-test (BIST) structure is presented which provides controllability and observability to analog circuits under test with significantly reduced hardware overhead compared to previously reported methods. The test structure is equally applicable to digital circuits, and lends itself to automated insertion into circuits under test
Keywords :
VLSI; built-in self test; controllability; mixed analogue-digital integrated circuits; observability; BIST; VLSI; analog circuits; automated insertion; built-in self-test; controllability; digital circuits; mixed-mode circuits; observability; test structure; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Consumer electronics; Digital circuits; Integrated circuit testing; Latches; Observability; Shift registers;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
