Experiment on fault location in large-scale analog circuits

Author

Chen, Yunqing

Author_Institution

Res. Inst. of Data Commun., Beijing, China

Volume

42

Issue

1

fYear

1993

fDate

2/1/1993 12:00:00 AM

Firstpage

30

Lastpage

34

Abstract

An experiment has been designed to identify faulty subnetworks under a nodal decomposition strategy. It is based on checking the voltage consistency of internal analyzable nodes in analyzable subnetworks. The concept of a minimal subnetwork is used to derive a minimal decomposition algorithm which can be combined with three basic voltage-testing conditions. The approach is applicable to both linear and nonlinear large networks. In the experiment, automatic testing equipment (ATE) is used to diagnose an active low-pass filter. The diagnosis procedure can be quickly completed, and the results have proved its effectiveness

Keywords

active filters; analogue circuits; automatic test equipment; automatic testing; fault location; low-pass filters; voltage measurement; ATE; active low-pass filter; analyzable subnetworks; automatic testing equipment; diagnosis; fault location; faulty subnetworks; internal analyzable nodes; large-scale analog circuits; linear networks; minimal decomposition algorithm; minimal subnetwork; nodal decomposition strategy; nonlinear large networks; voltage-testing; Active filters; Analog circuits; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Independent component analysis; Large-scale systems; Low pass filters; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.206675

Filename

206675