DocumentCode :
877387
Title :
Wide-band CMOS low-noise amplifier exploiting thermal noise canceling
Author :
Bruccoleri, Federico ; Klumperink, Eric A M ; Nauta, Bram
Author_Institution :
MESA+ Res. Inst., Univ. of Twente, Enschede, Netherlands
Volume :
39
Issue :
2
fYear :
2004
Firstpage :
275
Lastpage :
282
Abstract :
Known elementary wide-band amplifiers suffer from a fundamental tradeoff between noise figure (NF) and source impedance matching, which limits the NF to values typically above 3 dB. Global negative feedback can be used to break this tradeoff, however, at the price of potential instability. In contrast, this paper presents a feedforward noise-canceling technique, which allows for simultaneous noise and impedance matching, while canceling the noise and distortion contributions of the matching device. This allows for designing wide-band impedance-matching amplifiers with NF well below 3 dB, without suffering from instability issues. An amplifier realized in 0.25-μm standard CMOS shows NF values below 2.4 dB over more than one decade of bandwidth (i.e., 150-2000 MHz) and below 2 dB over more than two octaves (i.e., 250-1100 MHz). Furthermore, the total voltage gain is 13.7 dB, the -3-dB bandwidth is from 2 MHz to 1.6 GHz, the IIP2 is +12 dBm, and the IIP3 is 0 dBm. The LNA drains 14 mA from a 2.5-V supply and the die area is 0.3×0.25 mm2.
Keywords :
CMOS analogue integrated circuits; impedance matching; integrated circuit noise; thermal noise; wideband amplifiers; 0.25 micron; 13.7 dB; 14 mA; 150 to 2000 MHz; 2 MHz to 1.6 GHz; 2.5 V; LNA drains; distortion canceling; feedforward noise-canceling technique; global negative feedback; noise distortion; noise figure; source impedance matching; thermal noise canceling; voltage gain; wide-band CMOS low-noise amplifier; Bandwidth; Broadband amplifiers; Gain; Impedance matching; Low-noise amplifiers; Negative feedback; Noise cancellation; Noise figure; Noise measurement; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.821786
Filename :
1263653
Link To Document :
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