DocumentCode :
877448
Title :
A new effect at high currents in heterostructure bipolar transistors
Author :
Tiwari, Sandip
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
9
Issue :
3
fYear :
1988
fDate :
3/1/1988 12:00:00 AM
Firstpage :
142
Lastpage :
144
Abstract :
Large current densities in heterostructure bipolar transistors with heterostructure collectors are shown to cause an excess electron barrier leading to an increase in minority-carrier charge storage in the base and a decrease in current gain of the device. This effect occurs at current densities where the mobile charge in the collector depletion region significantly reduces the electrostatic field, thus exposing an electron chemical potential barrier due to bandgap grading at the junction. The effect appears at lower current densities than the Kirk effect and should occur in wide-gap heterostructure collector devices. The effect is demonstrated using experimental data and analyzed using device modeling; solutions are suggested for its elimination.<>
Keywords :
bipolar transistors; carrier density; minority carriers; bandgap grading; collector depletion region; current densities; current gain; device modeling; electron chemical potential barrier; electrostatic field; excess electron barrier; heterostructure bipolar transistors; high currents; minority-carrier charge storage; wide-gap heterostructure collector devices; Bipolar transistors; Chemicals; Current density; Current measurement; Doping; Electrons; Electrostatics; Gallium arsenide; Photonic band gap; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.2069
Filename :
2069
Link To Document :
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