DocumentCode :
877732
Title :
The close attached capacitor: a solution to switching noise problems
Author :
Hashemi, Seyed Hassan ; Sandborn, Peter A. ; Disko, David ; Evans, Richard
Author_Institution :
Microelectronics & Computer Technology Corp., Austin, TX, USA
Volume :
15
Issue :
6
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
1056
Lastpage :
1063
Abstract :
A new low-cost post-attach bypassing technique called close attached capacitor (CAC) is analyzed. It offers an attractive alternative to managing switching noise in single-chip or multichip packages. The CAC is a thin, flat capacitor, comparable in size to an IC die, that is placed on the active surface of the die and connected to on-chip power and ground pads through very short bonds. Environmental testing of the CAC process has been performed, indicating no device parameter degradation when attachment is made to the active surface of a passivated die. CAC design issues are addressed and the feasibility of manufacturing high-frequency capacitors and their assemblies using conventional reworkable or permanent attach processes is demonstrated. Examples of the integration of CACs in high-performance single-chip packages and in chips on multichip modules (MCMs) are shown, and the effectiveness of CACs in the reduction of switching noise is demonstrated
Keywords :
capacitors; electromagnetic compatibility; monolithic integrated circuits; multichip modules; packaging; by-pass capacitors; close attached capacitor; delta-I noise; flat capacitor; high-frequency capacitors; managing switching noise; multichip modules; multichip packages; on-chip power; passivated die; permanent attach processes; short bonds; single-chip packages; switching noise reduction; Assembly; Capacitors; Degradation; Integrated circuit noise; Manufacturing processes; Multichip modules; Packaging; Performance evaluation; Testing; Working environment noise;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.206931
Filename :
206931
Link To Document :
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