Title :
New Analytical Solutions of the Diffusion Equation Available to Radiation Induced Substrate Currents Modeling
Author_Institution :
CNES, Toulouse
Abstract :
This paper describes some new solutions of the diffusion equation in a semiconductor slab. These solutions are computed for Dirichlet null boundary conditions in the top and bottom planes of the slab and with a null internal electric field. The proposed model takes into account a finite diffusion length and an inclined trajectory. Such solutions may be used for radiation induced substrate diffusion currents modeling.
Keywords :
Green´s function methods; carrier density; carrier lifetime; current density; radiation effects; semiconductor materials; substrates; Dirichlet null boundary conditions; Green function; analytical solutions; carrier current density; carrier recombination effect; diffusion equation; finite diffusion length; null internal electric field; particle trajectory; radiation induced substrate diffusion currents modeling; semiconductor slab; Analytical models; Boundary conditions; Charge carrier density; Detectors; Equations; Green function; Ohmic contacts; Particle tracking; Slabs; Substrates; Analytical solution; diffusion equation; radiation; substrate currents;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2000768