DocumentCode :
877877
Title :
New Analytical Solutions of the Diffusion Equation Available to Radiation Induced Substrate Currents Modeling
Author :
Rolland, Guy
Author_Institution :
CNES, Toulouse
Volume :
55
Issue :
4
fYear :
2008
Firstpage :
2028
Lastpage :
2035
Abstract :
This paper describes some new solutions of the diffusion equation in a semiconductor slab. These solutions are computed for Dirichlet null boundary conditions in the top and bottom planes of the slab and with a null internal electric field. The proposed model takes into account a finite diffusion length and an inclined trajectory. Such solutions may be used for radiation induced substrate diffusion currents modeling.
Keywords :
Green´s function methods; carrier density; carrier lifetime; current density; radiation effects; semiconductor materials; substrates; Dirichlet null boundary conditions; Green function; analytical solutions; carrier current density; carrier recombination effect; diffusion equation; finite diffusion length; null internal electric field; particle trajectory; radiation induced substrate diffusion currents modeling; semiconductor slab; Analytical models; Boundary conditions; Charge carrier density; Detectors; Equations; Green function; Ohmic contacts; Particle tracking; Slabs; Substrates; Analytical solution; diffusion equation; radiation; substrate currents;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.2000768
Filename :
4636916
Link To Document :
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