• DocumentCode
    878096
  • Title

    Soft Errors in SRAM-FPGAs: A Comparison of Two Complementary Approaches

  • Author

    Alderighi, Monica ; Casini, Fabio ; D´Angelo, Sergio ; Mancini, Marcello ; Pastore, Sandro ; Sterpone, Luca ; Violante, Massimo

  • Author_Institution
    Ist. Naz. di Astrofis., Milan
  • Volume
    55
  • Issue
    4
  • fYear
    2008
  • Firstpage
    2267
  • Lastpage
    2273
  • Abstract
    As SRAM-based field-programmable gate arrays (FPGAs) are introduced in safety- or mission-critical applications, the availability of suitable Electronic Design Automation (EDA) tools for predicting systems dependability becomes mandatory for designers. Nowadays designers can opt either for workload-independent EDA tools, which provide information about system´s dependability disregarding the workload the system is supposed to elaborate when deployed in the mission, or workload-dependent approaches. In this paper, we compare two tools for predicting the effects of soft errors in circuits implemented using SRAM-based FPGAs, a workload-independent one (STAR) and a workload-dependent one (FLIPPER). Experimental results show that the two tools are complementary and can be used fruitfully for obtaining accurate predictions.
  • Keywords
    electronic design automation; field programmable gate arrays; SRAM-FPGA; electronic design automation; soft errors; Circuit faults; Computer applications; Costs; Electronic design automation and methodology; Field programmable gate arrays; Life estimation; Mission critical systems; Optimized production technology; Redundancy; System testing; Dependability; fault injection; field-programmable gate array (FPGA); single-event effects (SEVs); triple modular redundancy (TMR);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2000479
  • Filename
    4636939