Title :
Soft Errors in SRAM-FPGAs: A Comparison of Two Complementary Approaches
Author :
Alderighi, Monica ; Casini, Fabio ; D´Angelo, Sergio ; Mancini, Marcello ; Pastore, Sandro ; Sterpone, Luca ; Violante, Massimo
Author_Institution :
Ist. Naz. di Astrofis., Milan
Abstract :
As SRAM-based field-programmable gate arrays (FPGAs) are introduced in safety- or mission-critical applications, the availability of suitable Electronic Design Automation (EDA) tools for predicting systems dependability becomes mandatory for designers. Nowadays designers can opt either for workload-independent EDA tools, which provide information about system´s dependability disregarding the workload the system is supposed to elaborate when deployed in the mission, or workload-dependent approaches. In this paper, we compare two tools for predicting the effects of soft errors in circuits implemented using SRAM-based FPGAs, a workload-independent one (STAR) and a workload-dependent one (FLIPPER). Experimental results show that the two tools are complementary and can be used fruitfully for obtaining accurate predictions.
Keywords :
electronic design automation; field programmable gate arrays; SRAM-FPGA; electronic design automation; soft errors; Circuit faults; Computer applications; Costs; Electronic design automation and methodology; Field programmable gate arrays; Life estimation; Mission critical systems; Optimized production technology; Redundancy; System testing; Dependability; fault injection; field-programmable gate array (FPGA); single-event effects (SEVs); triple modular redundancy (TMR);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2000479