Title :
A New Mitigation Approach for Soft Errors in Embedded Processors
Author :
Abate, Francesco ; Sterpone, Luca ; Violante, Massimo
Author_Institution :
Politec. di Torino, Turin
Abstract :
Embedded processors, like for example processor macros inside modern FPGAs, are becoming widely used in many applications. As soon as these devices are deployed in radioactive environments, designers need hardening solutions to mitigate radiation-induced errors. When low-cost applications have to be developed, the traditional hardware redundancy-based approaches exploiting m-way replication and voting are no longer viable as too expensive, and new mitigation techniques have to be developed. In this paper we present a new approach, based on processor duplication, checkpoint and rollback, to detect and correct soft errors affecting the memory elements of embedded processors. Preliminary fault injection results performed on a PowerPC-based system confirmed the efficiency of the approach.
Keywords :
embedded systems; fault tolerance; integrated circuit design; integrated circuit reliability; memory architecture; microprocessor chips; radiation effects; radiation hardening (electronics); PowerPC-based system; embedded processors; fault injection; hardening solutions; hardware redundancy-based approaches; memory elements; mitigation approach; processor checkpoint; processor duplication; processor rollback; radiation-induced errors; radioactive environments; single event effects; soft errors; Application software; Computer aided instruction; Costs; Fault detection; Field programmable gate arrays; Hardware; Monitoring; Redundancy; Registers; Voting; Embedded processors reliability; fault injection; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2000839