Title :
Input offset compensation scheme with reduced sensitivity to charge injection and leakage
Author :
Ramírez-Angulo, J. ; Garimella, A. ; Garimella, L.M.K. ; López-Martin, A.J. ; Carvajal, R.G.
Author_Institution :
Klipsch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
fDate :
3/16/2006 12:00:00 AM
Abstract :
A simple input offset compensation scheme, with reduced sensitivity to charge injection and leakage, is introduced. It stores an amplified version of the offset that is applied during normal operation on the input side through a capacitive divider. Offset compensation takes place in a voltage additive manner in a separate path from the input signal. Experimental results of a test chip are shown that validate the proposed scheme.
Keywords :
CMOS analogue integrated circuits; charge injection; operational amplifiers; CMOS technology; capacitive divider; charge injection; charge leakage; floating-gate operational amplifier; input offset compensation scheme; sensitivity;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20064320
