Title :
Study of Single-Event Transients in High-Speed Operational Amplifiers
Author :
Jaulent, P. ; Pouget, V. ; Lewis, D. ; Fouillat, P.
Author_Institution :
IMS Lab., Univ. of Bordeaux, Talence
Abstract :
This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
Keywords :
analogue integrated circuits; application specific integrated circuits; integrated circuit design; operational amplifiers; radiation effects; transient analysis; wideband amplifiers; ASIC design; COTS selection; analog single-event transients; application specific integrated circuits; commercial off the shelf devices; high-speed operational amplifiers; wide bandwidth operational amplifiers; Application specific integrated circuits; Bandwidth; Filters; Frequency; Ionization; Operational amplifiers; Polarization; Silicon; Space technology; Voltage; ASET; SPA; high-speed; laser; laser cross section; laser mapping; op-amp; simulation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.920265
