DocumentCode
878213
Title
Study of Single-Event Transients in High-Speed Operational Amplifiers
Author
Jaulent, P. ; Pouget, V. ; Lewis, D. ; Fouillat, P.
Author_Institution
IMS Lab., Univ. of Bordeaux, Talence
Volume
55
Issue
4
fYear
2008
Firstpage
1974
Lastpage
1981
Abstract
This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
Keywords
analogue integrated circuits; application specific integrated circuits; integrated circuit design; operational amplifiers; radiation effects; transient analysis; wideband amplifiers; ASIC design; COTS selection; analog single-event transients; application specific integrated circuits; commercial off the shelf devices; high-speed operational amplifiers; wide bandwidth operational amplifiers; Application specific integrated circuits; Bandwidth; Filters; Frequency; Ionization; Operational amplifiers; Polarization; Silicon; Space technology; Voltage; ASET; SPA; high-speed; laser; laser cross section; laser mapping; op-amp; simulation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.920265
Filename
4636950
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