• DocumentCode
    878335
  • Title

    A static random-access memory with normally-off-type Schottky barrier FET´s

  • Author

    Suzuki, Shun´Ichi ; Nagahashi, Yasuhiko ; Tanaka, Takeo ; Yamada, Teruhiko ; Muta, Hiroki ; Okabayashi, Hidekazu ; Yamada, Kunio

  • Volume
    8
  • Issue
    5
  • fYear
    1973
  • Firstpage
    326
  • Lastpage
    331
  • Abstract
    A large-scale integrated memory with lower power consumption and high operating speed has been developed and evaluated. A fully decoded 256-b static random-access memory chip was fabricated by using the Enhancement-type Schottky Barrier gate FET´s, having a threshold voltage of 0.1 V, obtained by ion-implantation. The memory chip was successfully operated with an access time of less than 150 ns, and with active power consumption of 15 mW/chip. A single power supply of -1.3 V and current mode logic input levels are additional features of the memory chip.
  • Keywords
    Digital integrated circuits; Large scale integration; Random-access storage; Semiconductor storage systems; digital integrated circuits; large scale integration; random-access storage; semiconductor storage systems; Circuits; Energy consumption; FETs; Large scale integration; Logic; Power supplies; Random access memory; Schottky barriers; Silicon; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1973.1050412
  • Filename
    1050412