DocumentCode
878335
Title
A static random-access memory with normally-off-type Schottky barrier FET´s
Author
Suzuki, Shun´Ichi ; Nagahashi, Yasuhiko ; Tanaka, Takeo ; Yamada, Teruhiko ; Muta, Hiroki ; Okabayashi, Hidekazu ; Yamada, Kunio
Volume
8
Issue
5
fYear
1973
Firstpage
326
Lastpage
331
Abstract
A large-scale integrated memory with lower power consumption and high operating speed has been developed and evaluated. A fully decoded 256-b static random-access memory chip was fabricated by using the Enhancement-type Schottky Barrier gate FET´s, having a threshold voltage of 0.1 V, obtained by ion-implantation. The memory chip was successfully operated with an access time of less than 150 ns, and with active power consumption of 15 mW/chip. A single power supply of -1.3 V and current mode logic input levels are additional features of the memory chip.
Keywords
Digital integrated circuits; Large scale integration; Random-access storage; Semiconductor storage systems; digital integrated circuits; large scale integration; random-access storage; semiconductor storage systems; Circuits; Energy consumption; FETs; Large scale integration; Logic; Power supplies; Random access memory; Schottky barriers; Silicon; Threshold voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1973.1050412
Filename
1050412
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