• DocumentCode
    878493
  • Title

    a-Si1-xCx:H alloys for multijunction solar cells

  • Author

    Catalano, Anthony ; Newton, James ; Rothwarf, Allen

  • Author_Institution
    Solarex Corp., Newtown, PA, USA
  • Volume
    37
  • Issue
    2
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    391
  • Lastpage
    396
  • Abstract
    a-SiC:H alloys are promising candidates for the top junction alloy in triple-junction solar cells. In order to understand the limitations on electronic transport in the alloys, the photoconductivity and optical absorption were measured using photothermal deflection spectroscopy (PDS). Thin-film transistors have also been fabricated and studied. Taken together, the material and device measurements provide strong evidence that electron transport in the material is restricted by declining mobility in the alloys above a bandgap of approximately 1.9 eV. p-i-n devices based on the alloys have exhibited open-circuit voltages as high as 1.05 V, but the fill factors of the devices decline at these high voltages. The open-circuit voltage of the devices scales with optical bandgap, and measurements of Voc versus temperature indicate that generation-recombination controls the open-circuit voltage. Triple-junction devices containing 1.85-eV a-SiC:H and 1.45-eV SiGe:H have shown conversion efficiencies of 10.2%
  • Keywords
    amorphous semiconductors; hydrogen; semiconductor materials; silicon compounds; solar cells; 1.45 eV; 1.85 eV; PDS; SiGe:H; amorphous Si1-xCx:H; conversion efficiencies; electron transport; fill factors; generation-recombination; multijunction solar cells; open-circuit voltages; optical absorption; optical bandgap; photoconductivity; photothermal deflection spectroscopy; top junction alloy; triple-junction solar cells; Absorption; Electron optics; Optical devices; Optical materials; Photoconducting materials; Photoconductivity; Photonic band gap; Photovoltaic cells; Spectroscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.46372
  • Filename
    46372