DocumentCode
878659
Title
Limitation of properties of field-effect transistors
Author
Evans, L.
Volume
54
Issue
1
fYear
1966
Firstpage
82
Lastpage
83
Keywords
Chebyshev approximation; Current measurement; Data engineering; Electron tubes; FETs; Fourier transforms; Insulation; Out of order; Transconductance; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1966.4602
Filename
1446532
Link To Document