DocumentCode :
878678
Title :
Negative resistance in a transistor under punch-through conditions
Author :
Thomas, R.E. ; Johnston, Ronald H. ; Boothroyd, A.R.
Volume :
54
Issue :
1
fYear :
1966
Firstpage :
84
Lastpage :
85
Keywords :
Avalanche breakdown; Breakdown voltage; Charge carrier processes; Electric breakdown; Electron emission; Silicon; Spontaneous emission;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.4604
Filename :
1446534
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=878678
