DocumentCode

878678

Title

Negative resistance in a transistor under punch-through conditions

Author

Thomas, R.E. ; Johnston, Ronald H. ; Boothroyd, A.R.

Volume

54

Issue

1

fYear

1966

Firstpage

84

Lastpage

85

Keywords

Avalanche breakdown; Breakdown voltage; Charge carrier processes; Electric breakdown; Electron emission; Silicon; Spontaneous emission;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1966.4604

Filename

1446534