Noise sources identification in integrated circuits through correlation analysis

The identification and localization of noise sources in a linear integrated circuit affected by burst noise or excess 1/f noise is difficult because many devices are potentially responsible for the same output noise. In some practical cases, however, correlation measurement of the noise present at input, output, and other externally accessible terminals makes this identification possible. The method has been successfully employed in a power audio amplifier IC, and has led also to the identification of structural defects responsible for noise. The role of stacking faults, dislocation loops, and slip line dislocations in