Title :
Total-dose and single-event effects in DC/DC converter control circuitry
Author :
Adell, P.C. ; Schrimpf, R.D. ; Holman, W.T. ; Boch, J. ; Stacey, J. ; Ribero, P. ; Sternberg, A. ; Galloway, K.F.
Author_Institution :
Radiat. Effects & Reliability Group, Vanderbilt Univ., Nashville, TN, USA
Abstract :
Total-dose and single-event effects in the linear control circuitry of DC/DC power converters are examined. Catastrophic failure, induced by error-amplifier total-dose irradiation, is compared for two modes of operation. The use of a more robust restart mechanism to maintain the operation of the converter at a much higher dose level is presented. Single events result in missing pulses at the output of the control circuitry. Hybrid and integrated (SG1525A) pulse width modulators are evaluated to illustrate the missing-pulse results.
Keywords :
DC-DC power convertors; PWM power convertors; SPICE; X-ray effects; feedback amplifiers; ion beam effects; operational amplifiers; power supply circuits; radiation hardening (electronics); switching convertors; DC-DC power converters; SPICE; boost converter circuit; catastrophic failure; design hardening; error-amplifier irradiation; heavy ion testing; hybrid pulse width modulators; integrated pulse width modulators; large transient; linear control circuitry; missing pulses; operational amplifier; robust restart mechanism; single-event effects; switching power converters; total-dose effects; DC-DC power converters; MOSFET circuits; Operational amplifiers; Pulse amplifiers; Pulse circuits; Pulse width modulation; Pulse width modulation converters; Robustness; Space vector pulse width modulation; Threshold voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2003.820757
