DocumentCode
879262
Title
Relaxation oscillations due to impact ionisation in epitaxial sheet-type Gunn oscillators
Author
Acket, G.A.
Volume
5
Issue
8
fYear
1969
Firstpage
160
Lastpage
161
Abstract
Relaxation oscillations have been observed in field-ionised epitaxial nGaAs samples on a semi-insulating substrate. The decay times of excess electrons and light output are reduced by a transverse magnetic field, indicating the presence of free holes driven towards the surface or the interface by the Suhl effect.
Keywords
Gunn devices; oscillators; plasma oscillations;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19690119
Filename
4210334
Link To Document