Title :
Scientific and Technical Conventions
Author_Institution :
431 Ferne Ave., Palo Alto, Calif.
fDate :
4/1/1963 12:00:00 AM
Keywords :
Marketing and sales; Meetings; Missiles; Pattern recognition; Recruitment; Seminars; Shape; Testing;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1963.263432
