DocumentCode :
879759
Title :
Automatic EEG Artifact Removal: A Weighted Support Vector Machine Approach With Error Correction
Author :
Shao, Shi-Yun ; Shen, Kai-Quan ; Ong, Chong Jin ; Wilder-Smith, Einar P V ; Xiao-Ping Li
Author_Institution :
Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore
Volume :
56
Issue :
2
fYear :
2009
Firstpage :
336
Lastpage :
344
Abstract :
An automatic electroencephalogram (EEG) artifact removal method is presented in this paper. Compared to past methods, it has two unique features: 1) a weighted version of support vector machine formulation that handles the inherent unbalanced nature of component classification and 2) the ability to accommodate structural information typically found in component classification. The advantages of the proposed method are demonstrated on real-life EEG recordings with comparisons made to several benchmark methods. Results show that the proposed method is preferable to the other methods in the context of artifact removal by achieving a better tradeoff between removing artifacts and preserving inherent brain activities. Qualitative evaluation of the reconstructed EEG epochs also demonstrates that after artifact removal inherent brain activities are largely preserved.
Keywords :
biology computing; electroencephalography; support vector machines; automatic EEG artifact removal; brain activities; structural information; weighted support vector machine; Biological materials; Brain; Electroencephalography; Error correction; Eyes; Heart; Independent component analysis; Mechanical engineering; Muscles; Support vector machine classification; Support vector machines; Artifact removal; electroencephalogram; error correction; weighted support vector machine (SVM); Algorithms; Artifacts; Artificial Intelligence; Blinking; Diagnostic Errors; Electrocardiography; Electroencephalography; Humans; Models, Cardiovascular; Reproducibility of Results; Signal Processing, Computer-Assisted;
fLanguage :
English
Journal_Title :
Biomedical Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9294
Type :
jour
DOI :
10.1109/TBME.2008.2005969
Filename :
4637841
Link To Document :
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