• DocumentCode
    880081
  • Title

    A high-speed P-channel random access 1024-bit memory made with electron lithography

  • Author

    Henderson, Richard C. ; Pease, R. Fabian ; Voshchenkov, Alexander M. ; Helm, Rohe F. ; Wadsack, Ronald L.

  • Volume
    10
  • Issue
    2
  • fYear
    1975
  • fDate
    4/1/1975 12:00:00 AM
  • Firstpage
    92
  • Lastpage
    96
  • Abstract
    A switched capacitor, p-channel, 1024 bit random access memory has been made with electron lithography. The basic circuit was the same as that described by Boll and Lynch (see abstr. B35355 or C22818 fo 1973) but with halved lateral dimensions. The gate length of the switching transistor was 4 /spl mu/m, and the chip size was 1.2/spl times/1.8 mm. In order to fabricate the device, a 1 /spl mu/m alignment accuracy was required. Even with this modest shrinking of feature size, the minimum access time of the memory was reduced from 100 ns to less than 50 ns.
  • Keywords
    Digital integrated circuits; Field effect transistors; Integrated circuit production; Monolithic integrated circuits; Random-access storage; Semiconductor storage devices; digital integrated circuits; field effect transistors; integrated circuit production; monolithic integrated circuits; random-access storage; semiconductor storage devices; Charge transfer; Charge-coupled image sensors; Coupling circuits; Delay; Electron devices; Lithography; MOS capacitors; MOSFETs; Solid state circuits; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1975.1050567
  • Filename
    1050567