DocumentCode
880081
Title
A high-speed P-channel random access 1024-bit memory made with electron lithography
Author
Henderson, Richard C. ; Pease, R. Fabian ; Voshchenkov, Alexander M. ; Helm, Rohe F. ; Wadsack, Ronald L.
Volume
10
Issue
2
fYear
1975
fDate
4/1/1975 12:00:00 AM
Firstpage
92
Lastpage
96
Abstract
A switched capacitor, p-channel, 1024 bit random access memory has been made with electron lithography. The basic circuit was the same as that described by Boll and Lynch (see abstr. B35355 or C22818 fo 1973) but with halved lateral dimensions. The gate length of the switching transistor was 4 /spl mu/m, and the chip size was 1.2/spl times/1.8 mm. In order to fabricate the device, a 1 /spl mu/m alignment accuracy was required. Even with this modest shrinking of feature size, the minimum access time of the memory was reduced from 100 ns to less than 50 ns.
Keywords
Digital integrated circuits; Field effect transistors; Integrated circuit production; Monolithic integrated circuits; Random-access storage; Semiconductor storage devices; digital integrated circuits; field effect transistors; integrated circuit production; monolithic integrated circuits; random-access storage; semiconductor storage devices; Charge transfer; Charge-coupled image sensors; Coupling circuits; Delay; Electron devices; Lithography; MOS capacitors; MOSFETs; Solid state circuits; Threshold voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1975.1050567
Filename
1050567
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