DocumentCode :
880089
Title :
Correlation of neutron dosimetry using a silicon equivalent proportional counter microdosimeter and SRAM SEU cross sections for eight neutron energy spectra
Author :
Gersey, B. ; Wilkins, R. ; Huff, H. ; Dwivedi, R.C. ; Takala, B. ; Donnell, J.O. ; Wender, S.A. ; Singleterry, Robert C., Jr.
Author_Institution :
NASA Center for Appl. Radiat. Res., Prairie View A&M Univ., TX, USA
Volume :
50
Issue :
6
fYear :
2003
Firstpage :
2363
Lastpage :
2366
Abstract :
A silicon equivalent proportional counter microdosimeter (SEPCM) and 4 Mb SRAM were exposed to eight progressively hardened neutron energy spectra at the LANSCE ICE House facility. As the incident neutron energy spectra were hardened, the lineal energy spectra response from the SEPCM changed both in shape and in the number of lineal energy deposition events per incident neutron. The general trend of the 4 Mb SRAM single event upset (SEU) cross section was an increase for harder incident neutron energy spectra. Resulting dosimetric results were correlated to SEU cross sections.
Keywords :
SRAM chips; dosimetry; neutron detection; neutron effects; proportional counters; radiation hardening (electronics); silicon radiation detectors; SEPCM; SRAM SEU cross sections; Si equivalent proportional counter microdosimeter; lineal energy spectra response; neutron dosimetry; neutron energy spectra; Atmosphere; Counting circuits; Dosimetry; Ice; NASA; Neutrons; Radiation detectors; Random access memory; Silicon; Single event upset;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2003.821604
Filename :
1263886
Link To Document :
بازگشت