A compact portable setup for in situ solar cells degradation

Author

Filevich, A. ; Bruno, C.J. ; Vázquez, J. Fernández ; Alurralde, M. ; Prario, I. ; Tamasi, M.J.L. ; Bogado, M. G Martínez ; Plá, J.C. ; Durán, J. ; Schuff, J. ; Burlón, A. ; Stoliar, P. ; Minsky, D. ; Kreiner, A.J. ; Mayer, R.

Author_Institution

Phys. Dept., CNEA, Buenos Aires, Argentina

Volume

50

Issue

6

fYear

2003

Firstpage

2380

Lastpage

2384

Abstract

We describe a new method for in situ study of solar cell degradation that accumulates the damage produced by several subsequent fluences of radiation on the same cell. We have used this method to obtain a full characterization of silicon cells after inducing radiation damage with 8-MeV and 10-MeV protons and with 2.65-MeV electrons. A flexible portable setup was developed with this purpose. We have used this setup to compare the equivalent proton fluences between the JPL method and a new method, proposed by Alurralde, for estimation of the damage produced in solar cells by the protons present in low-altitude orbits.

Keywords

electron beam effects; proton effects; solar cells; 10 MeV; 2.65 MeV; 8 MeV; Si; Si cells; compact portable setup; damage; low-altitude orbits; several subsequent fluences of radiation; solar cells degradation; Degradation; Electrons; Laboratories; Orbits; Particle beams; Photovoltaic cells; Photovoltaic systems; Protons; Solar power generation; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2003.821580

Filename

1263889