Title :
A Note On Threshold Device Error Analysis
Author_Institution :
Lincoln Laboratories, Mass. Inst. Tech., Lexington, Mass.
Keywords :
Application software; Artificial intelligence; Automata; Error analysis; Feedback loop; Inspection; Logic; Noise measurement;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1963.263475
