• DocumentCode
    880411
  • Title

    A 14-bit digitally self-calibrated pipelined ADC with adaptive bias optimization for arbitrary speeds up to 40 MS/s

  • Author

    Iizuka, Kunihiko ; Matsui, Hirofumi ; Ueda, Masaya ; Daito, Mutsuo

  • Author_Institution
    Adv. Technol. Res. Labs., Sharp Corp., Nara, Japan
  • Volume
    41
  • Issue
    4
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    883
  • Lastpage
    890
  • Abstract
    This paper presents a 14-bit digitally self-calibrated pipelined analog-to-digital converter (ADC) featuring adaptive bias optimization. Adaptive bias optimization controls the bias currents of the amplifiers in the ADC to the minimum amount required, depending on the sampling speed, environment temperature, and power-supply voltage, as well as the variations in chip fabrication. It utilizes information from the digital calibration process and does not require additional analog circuits. The prototype ADC occupies an area of 0.5×2.3 mm2 in a 0.18-μm dual-gate CMOS technology; with a power supply of 2.8 V, it consumes 19.2, 33.7, 50.5, and 72.8 mW when operating at 10, 20, 30, and 40 MS/s, respectively. The peak differential nonlinearity (DNL) is less than 0.5 least significant bit (LSB) for all the sampling speeds with temperature variation up to 80°C. When operated at 20 MS/s with 1-MHz input, the ADC achieves 72.1-dB SNR and 71.1-dB SNDR.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; circuit optimisation; pipeline processing; 0.18 micron; 14 bit; 19.2 mW; 2.8 V; 33.7 mW; 50.5 mW; 72.8 mW; adaptive bias optimization; analog-digital converter; chip fabrication; differential nonlinearity; digital calibration process; dual-gate CMOS technology; environment temperature; power-supply voltage; sampling speed; self-calibrated pipelined ADC; Adaptive control; Analog-digital conversion; CMOS technology; Chip scale packaging; Power amplifiers; Programmable control; Sampling methods; Temperature control; Temperature dependence; Voltage control; Adaptive system; CMOS analog integrated circuits; CMOS integrated circuits; analog-to-digital (A/D) converters; analog-to-digital conversion (ADC); calibration; optimization; pipeline processing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.870788
  • Filename
    1610633