DocumentCode :
880464
Title :
On the use of system identification for accurate parametric modeling of nonlinear systems using noisy measurements
Author :
Vandersteen, Gerd ; Rolain, Yves ; Schoukens, Johan ; Pintelon, Rik
Author_Institution :
Dept. ELEC, Vrije Univ., Brussels, Belgium
Volume :
45
Issue :
2
fYear :
1996
fDate :
4/1/1996 12:00:00 AM
Firstpage :
605
Lastpage :
609
Abstract :
This paper gives a survey of identification methods for static, strongly nonlinear systems. A robust estimation algorithm is proposed for the estimation of static, nonlinear systems which can be described as a nonlinear function corrected with a rational form. The errors-in-variables-based algorithm solves the starting-value problem using an iterative, weighted least-squares procedure, constructs the rational form such that the set of normal equations becomes best conditioned, and uses a maximum-likelihood estimation step to increase the efficiency of the estimates. Properties discussed are illustrated by the measured static, strongly nonlinear dc characteristic of a forward-biased p-i-n diode
Keywords :
approximation theory; characteristics measurement; electric variables measurement; identification; iterative methods; least squares approximations; maximum likelihood estimation; nonlinear systems; p-i-n diodes; polynomials; semiconductor device models; efficiency; errors-in-variables-based algorithm; estimation algorithm; forward-biased p-i-n diode; iterative weighted least-squares procedure; maximum-likelihood estimation step; noisy measurements; nonlinear dc characteristic; nonlinear function; normal equations; parametric modeling; rational form; starting-value problem; static nonlinear systems; system identification; Additive noise; Least squares approximation; Maximum likelihood estimation; Noise measurement; Nonlinear systems; P-i-n diodes; Parametric statistics; Pollution measurement; Polynomials; System identification;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.492796
Filename :
492796
Link To Document :
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