Title :
A 4096-bit high-speed emitter-coupled-logic (ECL) compatible random-access memory
Author :
Ebel, Mark S. ; Gionis, John ; Regitz, William M.
Abstract :
A 4096-bit pseudostatic MOS random-access memory with emitter-coupled (ECL) compatibility on all inputs including clocks is described. This device exhibits access times of under 80 ns and cycle times of under 150 ns with a standby dissipation of 300 mW. The fully decoded memory is fabricated on a 204/spl times/237 mil silicon chip and is assembled in a 22-lead ceramic dual-in-line package.
Keywords :
Current-mode logic; Digital integrated circuits; Monolithic integrated circuits; Random-access storage; Semiconductor storage systems; current-mode logic; digital integrated circuits; monolithic integrated circuits; random-access storage; semiconductor storage systems; Assembly; Ceramics; Circuits; Clocks; Costs; Decoding; Logic devices; Semiconductor device packaging; Silicon; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1975.1050609
