DocumentCode
880586
Title
A nonvolatile charge-addressed memory (NOVCAM) cell
Author
White, Marvin H. ; Lampe, Donald R. ; Fagan, John L. ; Kub, Francis J. ; Barth, Douglas A.
Volume
10
Issue
5
fYear
1975
Firstpage
281
Lastpage
287
Abstract
A nonvolatile charge-addressed memory (NOVCAM) cell is described in a 64-bit shift register configuration. The charge address is performed by a charge-coupled device (CCD) shift register and the information is stored in metal-nitride-oxide-silicon (MNOS) nonvolatile sites located in parallel with the CCD shift register. The tunneling electric field strength across the thin-oxide MNOS structure is controlled by the magnitude of the charge transferred from the CCD register. The write, erase, and read modes of operation are discussed with typical /spl plusmn/20 V 10 /spl mu/s write/erase, and 2 V 2 /spl mu/s read conditions. Readout is accomplished by parallel stabilized charge injection from a diffused p/n junction to minimize access time to the first bit.
Keywords
Charge-coupled devices; Digital integrated circuits; Monolithic integrated circuits; Semiconductor storage systems; Shift registers; charge-coupled devices; digital integrated circuits; monolithic integrated circuits; semiconductor storage systems; shift registers; Capacitance; Capacitors; Charge coupled devices; Dielectrics; Electrodes; Nonvolatile memory; Read-write memory; Shift registers; Threshold voltage; Tunneling;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1975.1050612
Filename
1050612
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