Title :
A 1024-bit MNOS RAM using avalanche-tunnel injection
Author :
Uchida, Yukimasa ; Endo, Norio ; Saito, Shozo ; Konaka, Masami ; Nojima, Isao ; Nishi, Yoshio ; Tamaru, Keikichi
Abstract :
MNOS memory cells which consist of one MNOS transistor and two MOS transistors are incorporated into a fully decoded 1024-word by 1-bit random access memory (RAM) with nonvolatility. The features of the present nonvolatile RAM are: 1) by introducing a novel mode of write operation, electrical isolators, such as p-n junction isolation between the memory cells and the other circuits are not required, 2) stored data can last more than one year without any kind of external power supply, 3) the chip size of the memory is 3.60/spl times/3.61 mm/SUP 2/, 4) the read-access time is 600 ns and the write cycle time is 10 /spl mu/s-100 /spl mu/s.
Keywords :
Digital integrated circuits; Monolithic integrated circuits; Random-access storage; Semiconductor storage systems; Tunnelling; digital integrated circuits; monolithic integrated circuits; random-access storage; semiconductor storage systems; tunnelling; Circuits; EPROM; Electrons; MOSFETs; Random access memory; Read-write memory; Silicon; Threshold voltage; Tunneling; Writing;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1975.1050613