DocumentCode :
880652
Title :
Benchmarking semiconductor manufacturing
Author :
Leachman, Robert C. ; Hodges, David A.
Author_Institution :
Coll. of Eng., California Univ., Berkeley, CA, USA
Volume :
9
Issue :
2
fYear :
1996
fDate :
5/1/1996 12:00:00 AM
Firstpage :
158
Lastpage :
169
Abstract :
We are studying the manufacturing performance of semiconductor wafer fabrication plants in the US, Asia, and Europe. There are great similarities in production equipment, manufacturing processes, and products produced at these plants. Nevertheless, data reported here show that important quantitative measures of productivity vary by factors of 3 to as much as 5 across an international sample of 16 plants. We conducted on-site interviews with manufacturing personnel to better understand reasons for the observed wide variations in productivity. We have identified factors in the areas of information systems, organizational practices, process and technology improvements, and production control that correlate strongly with productivity
Keywords :
VLSI; computer integrated manufacturing; human resource management; integrated circuit manufacture; manufacturing data processing; production control; production engineering computing; quality control; CIM; benchmarking; information systems; manufacturing performance; manufacturing processes; organizational practices; production control; production equipment; productivity; semiconductor manufacturing; semiconductor wafer fabrication plants; Asia; Europe; Fabrication; Information systems; Manufacturing processes; Personnel; Production control; Production equipment; Productivity; Semiconductor device manufacture;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.492810
Filename :
492810
Link To Document :
بازگشت