Title :
On a composite model to the IC yield problem
Author :
Stapper, Charles H., Jr.
fDate :
12/1/1975 12:00:00 AM
Abstract :
In a recent paper, see ibid., vol. Sc-9, no.3, p.86-95 (1974), Warner proposed a composite model to the monolithic IC yield problem. This composite model is a multiparameter fit to a set of data originally described by Moore (1970). It is shown that these same data can be modeled equally well with negative binomial statistics with two parameters.
Keywords :
Integrated circuit production; Monolithic integrated circuits; integrated circuit production; monolithic integrated circuits; Equations; Fires; Insurance; Integrated circuit modeling; Integrated circuit yield; Reactive power; Road accidents; Statistical distributions; Telephony; Traffic control;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1975.1050655
