• DocumentCode
    881074
  • Title

    On a composite model to the IC yield problem

  • Author

    Stapper, Charles H., Jr.

  • Volume
    10
  • Issue
    6
  • fYear
    1975
  • fDate
    12/1/1975 12:00:00 AM
  • Firstpage
    537
  • Lastpage
    539
  • Abstract
    In a recent paper, see ibid., vol. Sc-9, no.3, p.86-95 (1974), Warner proposed a composite model to the monolithic IC yield problem. This composite model is a multiparameter fit to a set of data originally described by Moore (1970). It is shown that these same data can be modeled equally well with negative binomial statistics with two parameters.
  • Keywords
    Integrated circuit production; Monolithic integrated circuits; integrated circuit production; monolithic integrated circuits; Equations; Fires; Insurance; Integrated circuit modeling; Integrated circuit yield; Reactive power; Road accidents; Statistical distributions; Telephony; Traffic control;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1975.1050655
  • Filename
    1050655
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=881074