DocumentCode :
881129
Title :
Two-dimensional solution of the d.c. characteristics for the m.o.s.t.
Author :
Armstrong, G.A.
Volume :
5
Issue :
17
fYear :
1969
Firstpage :
406
Lastpage :
408
Abstract :
A method is outlined for the determination of a 2-dimensional solution of the potential distribution in the substrate of the m.o.s.t., based on the complete depletion-neutral approximation. Channel current is derived from a 1-dimensional solution of the continuity equation along the silicon-silicon dioxide interface, for given values of extrinsically applied electrode potentials. Theoretical characteristics have been validated by comparison with those of a practical device. A discussion of pinchoff is also included.
Keywords :
characteristics measurement; metal-insulator-semiconductor devices;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19690307
Filename :
4210527
Link To Document :
بازگشت