• DocumentCode
    881152
  • Title

    A Comparison of Conventional Dose Rate and Low Dose Rate Co-60 Testing of Idt Static RAMS and FSC Multiplexers

  • Author

    Schiff, Daniel ; Bruun, Jorgen ; Montesalvo, Mary ; Wong, C.-C.D.

  • Author_Institution
    Assurance Technology Corporation 84 South Street Carlisle, Massachusetts 01741
  • Volume
    32
  • Issue
    6
  • fYear
    1985
  • Firstpage
    4050
  • Lastpage
    4055
  • Abstract
    IDT71681L70 4K×4 static rams and FSC54F251 multiplexers failed conventional Co-60 radiation testing before reaching a cumulative dose of 10 Krad (Si). At a significantly lower dose rate of 23 rad (Si)/Hr these devices accumulated more than 38 Krad (Si) before failing. The effects on radiation hardness of going to a satellite mission dose rate of 2.3 rad(Si)/Hr are discussed.
  • Keywords
    Electronic equipment testing; Laboratories; Legged locomotion; MOS devices; Multiplexing; Power capacitors; Satellites; Semiconductor device testing; Semiconductor devices; Strips;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1985.4334067
  • Filename
    4334067
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=881152